Amanote Research

Amanote Research

    RegisterSign In

Discover open access scientific publications

Search, annotate, share and cite publications


Publications by ND Masters

Integrated Platform for Testing MEMS Mechanical Properties at the Wafer Scale by the IMaP Methodology

English

Related publications

Analysis of Carbon Nanotubes on the Mechanical Properties at Atomic Scale

Journal of Nanomaterials
Materials ScienceNanotechnologyNanoscience
2011English

Mechanical Properties of 3c-SiC Films for MEMS Applications

Materials Research Society Symposium - Proceedings
Mechanics of MaterialsMaterials ScienceCondensed Matter PhysicsMechanical Engineering
2007English

Temporary Wafer Bonding – Key Technologogy for MEMS Devices

Nanoindustry Russia
2018English

Experimental Plan for Testing the Mechanical Properties of High-Strength Concrete at Elevated Temperatures

1999English

Very Low Energy Implanted Bragg Gratings in SOI for Wafer Scale Testing Applications

2011English

Low-Temperature Wafer Bonding for Three-Dimensional Wafer-Scale Integration

2018English

Synthesis Methodology for Built-In At-Speed Testing

English

Wafer Scale Integration.

HYBRIDS
1990English

Wafer-Scale Homogeneity of Transport Properties in Epitaxial Graphene on SiC

Carbon
Materials ScienceChemistry
2015English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy