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Publications by Naoko Kato

Problems Concerning Application of Electron-Holography Observation of P-N Junctions From the Viewpoint of the Semiconductor Industry

Microscopy and Microanalysis
Instrumentation
2003English

Related publications

Observation of Dopant Concentration in GaN Semiconductor by High Sensitivity Electron Holography

Materia Japan
2019English

Precise Potential Observation of a Biased GaAs P-N Junction by in Situ Phase-Shifting Electron Holography

Materia Japan
2019English

A Theoretical Treatment of THz Resonances in Semiconductor GaAs P–n Junctions

Materials
Materials ScienceCondensed Matter Physics
2019English

Hot Electron Emission From Silicon P‐n Junctions Produced by Ion Implantation

Journal of Applied Physics
AstronomyPhysics
1966English

Study on the Barriers in Magnetic Tunnel Junctions by Electron Holography

Microscopy and Microanalysis
Instrumentation
2003English

The Determination and Interpretation of Electrically Active Charge Density Profiles at Reverse Biased P-N Junctions From Electron Holograms

Microscopy and Microanalysis
Instrumentation
2002English

Quantitative Examination of Reverse-Biased Semiconductor Devices Using Off- Axis Electron Holography

Microscopy and Microanalysis
Instrumentation
2002English

Direct Observation of Local Hot Electron Transport Through Al2O3 Tunnel Junctions

Applied Physics Letters
AstronomyPhysics
2002English

Observation of Electric Potential Distribution in Model Capacitor Sample Using Electron Holography

Materials Transactions
Mechanics of MaterialsMaterials ScienceCondensed Matter PhysicsMechanical Engineering
2012English

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