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Publications by Niamh Waldron
Capacitance-Frequency Estimates of Border-Trap Densities in Multi-Fin MOS Capacitors
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
Related publications
Charge Trapping Control in MOS Capacitors
IEEE Transactions on Industrial Electronics
Control
Systems Engineering
Computer Science Applications
Electrical
Electronic Engineering
Frequency Dependence of C-V Characteristics of MOS Capacitors Containing Nanosized High-Κ Ta2O5 Dielectrics
Advances in Materials Science and Engineering
Materials Science
Engineering
Form and Capacitance of Parallel-Plate Capacitors
IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A
Electron Beam Irradiation Effects in Thick-Oxide MOS Capacitors
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
Adaptable MOS Current Mode Logic for Multi-Band Frequency Synthesizers
MOS Uncertainty Estimates in an Ensemble Framework
Monthly Weather Review
Atmospheric Science
A Simple Method to Obtain the Generation Lifetime in MOS Capacitors
International Journal of New Technology and Research
Characterization, Preparation& Analysis of Oxide Based Capacitors for Gate of Mos Characteristics
International Journal of Advance Engineering and Research Development
Low Frequency Noise in Tantalum Capacitors
Active and Passive Electronic Components
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
