Frequency Dependence of C-V Characteristics of MOS Capacitors Containing Nanosized High-Κ Ta2O5 Dielectrics

Advances in Materials Science and Engineering- Egypt

doi 10.1155/2017/9745934

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Materials Science

Date

January 1, 2017

Authors

Nenad Novkovski

Elena Atanassova

Publisher

Hindawi Limited

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