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Publications by Noriaki Endo

Strain Analysis of FinFET Device Utilizing Moiré Fringes in Scanning Transmission Electron Microscopy

Microscopy and Microanalysis

Instrumentation

English

Development of a New Focused Ion Beam Preparation Method of Thin Film for TEM With FIB: A Method Capable of Re-Thinning After TEM Observation

Nippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals

Mechanics of Materials

Materials Chemistry

Condensed Matter Physics

English