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Publications by Norio Nomura

Highly Sensitive Image Inspection for Line Defect Using Projection Data Analysis

IEEJ Transactions on Electronics, Information and Systems
Electronic EngineeringElectrical
2000English

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An Image Analysis for Inspecting Nonwoven Defect

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An Inspection for Warp Knitted Fabric Using Image Processing

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Automatic Visual Inspection and Defect Detection on Variable Data Prints

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A Basic Study on Defect Inspection Method for ASIC Manufacturing Line (Second Report: Inspection Parameter Dependence on Yield and Cleaning Cycle)

IEEJ Transactions on Industry Applications
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Graphene Valley Filter Using a Line Defect

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Amplitude and Phase Defect Inspection on EUV Reticles Using RESCAN

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Planar Configuration for Image Projection

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Nonsegmenting Defect Detection and SOM-based Classification for Surface Inspection Using Color Vision

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Inner-Defect Inspection in Concrete Using Laser-Based Remote Sensing System

The Review of Laser Engineering
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