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Publications by Norio Nomura
Highly Sensitive Image Inspection for Line Defect Using Projection Data Analysis
IEEJ Transactions on Electronics, Information and Systems
Electronic Engineering
Electrical
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A Basic Study on Defect Inspection Method for ASIC Manufacturing Line (Second Report: Inspection Parameter Dependence on Yield and Cleaning Cycle)
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Amplitude and Phase Defect Inspection on EUV Reticles Using RESCAN
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Nonsegmenting Defect Detection and SOM-based Classification for Surface Inspection Using Color Vision
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