Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by O. Manzardo
The Metrology of a Miniature FT Spectrometer MOEMS Device Using White Light Scanning Interference Microscopy
Thin Solid Films
Surfaces
Alloys
Optical
Interfaces
Metals
Materials Chemistry
Magnetic Materials
Films
Coatings
Electronic
Related publications
Talc Aspect Ratios Measured by Scanning White Light Interference Microscopy (SWLIM)
Microscopy and Microanalysis
Instrumentation
Programmable Spectrometer Using MOEMs Devices for Space Applications
Scanning He+ Ion Beam Microscopy and Metrology
Submicrometer Microelectronics Dimensional Metrology: Scanning Electron Microscopy
Journal of Research of the National Bureau of Standards
Spectral Confocal Reflection Microscopy Using a White Light Source
Journal of the European Optical Society
Optics
Atomic
Molecular Physics,
High Resolution Surface Metrology Using Microsphere‐Assisted Interference Microscopy (Phys. Status Solidi a 13∕2019)
Physica Status Solidi (A) Applications and Materials Science
Surfaces
Electronic Engineering
Condensed Matter Physics
Materials Chemistry
Optical
Electrical
Magnetic Materials
Films
Coatings
Electronic
Interfaces
Using Confocal Laser Scanning Microscopy, Scanning Electron Microscopy and Phase Contrast Light Microscopy to Examine Marine Biofilms
Aquatic Microbial Ecology
Evolution
Ecology
Systematics
Aquatic Science
Behavior
A Miniature Particle Mass Spectrometer
Miniature Diode Spectrometer Design