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Publications by O.L. Krivanek
Ultra-High Vacuum Aberration-Corrected STEM for In-Situ Studies
Microscopy and Microanalysis
Instrumentation
Aberration-Corrected STEM for Elemental Mapping
Microscopy and Microanalysis
Instrumentation
Sub-Angstrom Probe Size in HADF-STEM at 120KV
Microscopy and Microanalysis
Instrumentation
STEM Aberration Correction: Where Next?
Microscopy and Microanalysis
Instrumentation
Application of Slow-Scan CCD Cameras in Routine Biological TEM
Microscopy Today
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