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Publications by P van Aken
Low-Dose Strain Mapping by Dark-Field Inline Electron Holography
Microscopy and Microanalysis
Instrumentation
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Strain Mapping of 45 Nm MOSFET by Dark-Field Inline Electron Holography
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Mapping of Process Induced Dopant Redistributions by Electron Holography
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Suppressing Geometric Phase Shift Owing to Antiphase Boundaries in Dark-Field Electron Holography
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Virtual Dark-Field and Virtual High Angle Angular Dark Field Images Reconstructed From Electron Diffraction Patterns
Portable Lensless Wide-Field Microscopy Imaging Platform Based on Digital Inline Holography and Multi-Frame Pixel Super-Resolution
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