Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by P. Statham
Progress in a New Method of Thickness Measurement by X-Ray Analysis in TEM
Microscopy and Microanalysis
Instrumentation
Related publications
Both Surface Inequi-Thickness Removal - Both Surface X-Ray Diffraction Method for Residual Stress Measurement in a Plate.
Transactions of the Japan Society of Mechanical Engineers Series A
Both Surface Inequi-Thickness Removal-Both Surface X-Ray Diffraction Method for Residual Stress Measurement in a Plate
Bulletin of the JSME
Engineering
The Measurement of Particle Size by the X-Ray Method
Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences
Mathematics
Engineering
Astronomy
Physics
Measurement of Coating Thickness by .BETA.-ray.
Journal of the Surface Finishing Society of Japan
New Analysis Method for CCD X-Ray Data
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
High Energy Physics
Instrumentation
Nuclear
Measurement of Paint Film Thickness on Prepainted Steel Sheet by Compton Scattered X-Ray
Tetsu-To-Hagane/Journal of the Iron and Steel Institute of Japan
Alloys
Condensed Matter Physics
Metals
Theoretical Chemistry
Materials Chemistry
Physical
On the Measurement of Residual Stress in Heat Treated Steel by X-Ray Method
Zairyo/Journal of the Society of Materials Science, Japan
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
X-Ray Residual Stress Measurement of Silicon Nitride by Gaussian Curve Method.
Transactions of the Japan Society of Mechanical Engineers Series A
Application of X-Ray Stress Measurement for Residual Stress Analysis by Inherent Strain Method - Comparison of Cosα and Sin2Ψ Method-
Mechanical Engineering Journal
