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Publications by Peter W. Deelman
Atom Probe Tomography: Accurate Quantification of Si/SiGe Interface Profiles via Atom Probe Tomography (Adv. Mater. Interfaces 21/2017)
Advanced Materials Interfaces
Mechanics of Materials
Mechanical Engineering
Related publications
Modeling Mass Spectrometry Profiles in Atom Probe Tomography
New Applications in Atom Probe Tomography
Microscopy and Microanalysis
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An Introduction to Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
Atom Probe Tomography Characterization of Multilayer Films
Microscopy and Microanalysis
Instrumentation
Introduction: Special Issue on Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
Three Dimensional Atom Probe Tomography of Nanoscale Thin Films, Interfaces and Particles
Atom Counting in Atom Probe Tomography Specimens Using Quantitative HAADF-STEM
Microscopy and Microanalysis
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Atom Probe Tomography: A Technique for Nanoscale Characterization
Microscopy and Microanalysis
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Promoting Standards in Quantitative Atom Probe Tomography Analysis
Microscopy and Microanalysis
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