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Publications by R. Plonka

Thickness Dependence of Intrinsic Dielectric Response and Apparent Interfacial Capacitance in Ferroelectric Thin Films

Journal of Applied Physics

English

Related publications

Curie Temperature and Critical Thickness of Ferroelectric Thin Films

Journal of Applied Physics

English

Effect of Thickness on Dielectric, Ferroelectric, and Optical Properties of Ni Substituted Pb(Zr0.2Ti0.8)O3 Thin Films

Journal of Applied Physics

English

Low Dielectric Loss and Multiferroic Properties in Ferroelectric/Mutiferroic/Ferroelectric Sandwich Structured Thin Films

Materials Chemistry

English

Thickness Dependence of the Ferroelectric PbTiO3 Thin Films on the Dipolar Relaxation in the Microwave-Frequency Range

Applied Physics Letters

English

Thickness Dependence of Leakage Current in BaBi2Ta2O9 Thin Films

Applied Physics Letters

English

Dielectric, Ferroelectric and Piezoelectric Properties of Sputtered PZT Thin Films on Si Substrates: Influence of Film Thickness and Orientation

Semiconductor Physics, Quantum Electronics and Optoelectronics

Electronic Engineering

Molecular Physics,

Magnetic Materials

English

Thickness Dependence of Ferromagnetic Resonance for Co and Ni80Fe20 Thin Films.

Journal of the Magnetics Society of Japan

English

Piezoresponse Force Microscopy of Ferroelectric Thin Films: Frequency Dependence of Phase Imaging

Journal of Applied Physics

English

Interfacial Compound Suppression and Dielectric Properties Enhancement of F–N Codoped ZrO2 Thin Films

Applied Physics Letters

English