Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by Robert Estivill
Atomic Scale Analysis of Dopants in CMOS Structures by Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
Related publications
Nanostructure Analysis by Laser Assisted Atom Probe Tomography
Vacuum and Surface Science
Atom-Probe Tomography of Semiconductor Materials and Device Structures
MRS Bulletin
Materials Science
Theoretical Chemistry
Condensed Matter Physics
Physical
Promoting Standards in Quantitative Atom Probe Tomography Analysis
Microscopy and Microanalysis
Instrumentation
Atomic Level Analysis of Surfaces by a Scanning Atom Probe (SAP)
Zairyo to Kankyo/ Corrosion Engineering
Surfaces
Alloys
Metals
Materials Chemistry
Electrochemistry
Films
Coatings
Interfacial Mixing Analysis for Strained Layer Superlattices by Atom Probe Tomography
Crystals
Materials Science
Inorganic Chemistry
Chemical Engineering
Condensed Matter Physics
Characterization of Ni-Base Superalloys on the Atomic Scale by Atom Probe Tomography and Spherical-Aberration Corrected Analytical Electron Microscopy Techniques
Microscopy and Microanalysis
Instrumentation
New Applications in Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
3D Atom Probe: Chemical Analysis With (Near) Atomic Resolution
Microscopy and Microanalysis
Instrumentation
An Introduction to Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
