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Publications by Ryuichiro Minato
Imaging of Built-In Electric Field at a P-N Junction by Scanning Transmission Electron Microscopy
Scientific Reports
Multidisciplinary
Analysis of GaAs Compound Semiconductors and the Semiconductor Laser Diode Using Off-Axis Electron Holography, Lorentz Microscopy, Electron Diffraction Microscopy and Differential Phase Contrast STEM
Microscopy and Microanalysis
Instrumentation
Related publications
Annular Bright Field Scanning Transmission Electron Microscopy Imaging Dynamics
Microscopy and Microanalysis
Instrumentation
Nanoscale Mapping of Built-In Potential in GaAs P–n Junction Using Light-Modulated Scanning Tunneling Microscopy
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Electric Field Observation Method for a P-N Junction by DPC STEM
Materia Japan
Development of Annular Dark Field Confocal Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Analysis of Crystal Defects by Scanning Transmission Electron Microscopy (STEM) in a Modern Scanning Electron Microscope
Advanced Structural and Chemical Imaging
Nuclear Medicine
Radiology
Chemical Engineering
Spectroscopy
Imaging
Toxoplasma Gondii Inside LLCMK2 Cells. A Study by Field Emission Scanning and Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Direct Imaging of the Depletion Region of an InP P–n Junction Under Bias Using Scanning Voltage Microscopy
Applied Physics Letters
Astronomy
Physics
Differential Phase Contrast Scanning Transmission Electron Microscopy at Atomic Resolution
Microscopy and Microanalysis
Instrumentation
Studying Vanadium-Based Perovskites by Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
