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Publications by S. Lopatin
Z-Contrast Imaging of Dislocation Cores at the Si/GaAs Interface
Microscopy and Microanalysis
Instrumentation
Atomic Resolution Z-Contrast Imaging and EELS: Application for Ge/SiO2 Interface
Microscopy and Microanalysis
Instrumentation
Related publications
Z-Contrast Imaging of Nanostructures in the STEM
Microscopy and Microanalysis
Instrumentation
Low Threading Dislocation Density GaAs Growth on On-Axis GaP/Si (001)
Journal of Applied Physics
Astronomy
Physics
Simulations of the Dislocation Array at Ge/Si Interfaces
Materials Research Society Symposium - Proceedings
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Abruptness of GaAs/InGaP Hetero Interfaces Analyzed by Z-Contrast STEM
Materia Japan
Relative Contrast in A-Si and C-Si in ADF-STEM Imaging
Microscopy and Microanalysis
Instrumentation
First-Principles Simulations and Z-Contrast Imaging of Impurities at Tilt Grain Boundaries in Mgo
Materials Research Society Symposium - Proceedings
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
ErSi2/Si (111) Interface Structure Determination From Lattice Imaging
Microscopy Microanalysis Microstructures
Pressure Dependence of Schottky Barrier Height at Pt/GaAs Interface
Materials Science Forum
