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Publications by S. Pravossoudovitch
Multiple-Cell-Upsets on a Commercial 90nm SRAM in Dynamic Mode
Analysis of Resistive-Bridging Defects in SRAM Core-Cells: A Comparative Study From 90nm Down to 40nm Technology Nodes
A Design-For-Diagnosis Technique for SRAM Write Drivers
A New Design-For-Test Technique for SRAM Core-Cell Stability Faults
Related publications
Neutron-Induced Soft Errors and Multiple Cell Upsets in 65-Nm 10T Subthreshold SRAM
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
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Single Event Upsets Under 14-MeV Neutrons in a 28-Nm SRAM-based FPGA in Static Mode
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
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Multiple Cell Upsets Correction for OLS Codes
International Journal of Advanced Research in Electrical, Electronics and Instrumentation Engineering
SRAM Cell Design for Stability Methodology
A Review on Low Power Sram
International Journal of Recent Trends in Engineering and Research
Analysis of 6T SRAM Cell in Different Technologies
Circulation in Computer Science
Impact of Dynamic Voltage Scaling and Thermal Factors on FinFET-based SRAM Reliability
High-Speed Multiple-Mode Mass-Sensing Resolves Dynamic Nanoscale Mass Distributions
Nature Communications
Astronomy
Genetics
Molecular Biology
Biochemistry
Chemistry
Physics
