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Publications by S. Sijbrandij
Towards Secondary Ion Mass Spectrometry on the Helium Ion Microscope: An Experimental and Simulation Based Feasibility Study With He+ and Ne+ Bombardment
Applied Physics Letters
Astronomy
Physics
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Secondary Ion Mass Spectrometry (SIMS)
Zairyo to Kankyo/ Corrosion Engineering
Surfaces
Alloys
Metals
Materials Chemistry
Electrochemistry
Films
Coatings
Secondary Ion Mass Spectrometry (SIMS)
Nanometer Scale Time of Flight Back Scattering Spectrometry in the Helium Ion Microscope
Microscopy and Microanalysis
Instrumentation
20th International Conference on Secondary Ion Mass Spectrometry (SIMS XX)
Biointerphases
Materials Science
Astronomy
Genetics
Molecular Biology
Biochemistry
Biomaterials
Chemistry
Physics
Materials Analysis Using Secondary Ion Mass Spectrometry: Challenges and Opportunities
Microscopy and Microanalysis
Instrumentation
Time of Flight Secondary Ion Mass Spectrometry: Chemical Imaging
Microscopy and Microanalysis
Instrumentation
Iterative Clustering and Classification Analysis of Secondary Ion Mass Spectrometry Images
Microscopy and Microanalysis
Instrumentation
Secondary Ion Mass Spectrometry Study of Erbium Titanium Codiffusion in Lithium Niobate
IEEE Photonics Technology Letters
Electronic Engineering
Optics
Molecular Physics,
Optical
Electrical
Atomic
Magnetic Materials
Electronic
Surface Damage of Stainless Steels by Helium Ion Bombardment
Transactions of the Japan Institute of Metals
