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Publications by S.-H. Renn
Floating Body and Hot Carrier Effects in Ultra-Thin Film SOI MOSFETs
Le Journal de Physique IV
Related publications
Mobility Enhancement of SOI MOSFETs Due to Subband Modulation in Ultra-Thin SOI Films
Revision of Interface Coupling in Ultra-Thin Body Silicon-On-Insulator MOSFETs
Semiconductor Physics, Quantum Electronics and Optoelectronics
Electronic Engineering
Optics
Molecular Physics,
Optical
Electrical
Atomic
Magnetic Materials
Electronic
Characterization of Ultrathin SOI Film and Application to Short Channel MOSFETs
Nanotechnology
Mechanics of Materials
Electronic Engineering
Mechanical Engineering
Materials Science
Nanoscience
Electrical
Bioengineering
Nanotechnology
Chemistry
Combined Negative Bias Temperature Instability and Hot Carrier Stress Effects in Low Temperature Poly-Si Thin Film Transistors
Investigation of Gate-Induced Drain Leakage (GIDL) Current in Thin Body Devices: Single-Gate Ultra-Thin Body, Symmetrical Double-Gate, and Asymmetrical Double-Gate MOSFETs
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Effective Density-Of-States Distribution of Polycrystalline Silicon Thin-Film Transistors Under Hot-Carrier Degradation
Journal of Applied Physics
Astronomy
Physics
Investigation and Comparison of Work Function Variation for FinFET and Ultra-Thin-Body SOI Devices Using a Voronoi Approach
Evidence of Carrier Accumulation Effects on the Response Enhancement in Thin-Film Electrochromic Devices
Spatially and Temporally Resolving the Degradation of N-Channel Poly-Si Thin-Film Transistors Under Hot-Carrier Stressing
Journal of Applied Physics
Astronomy
Physics
