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Publications by S.D. Findlay
Simulating Inelastic Scattering in Scanning Transmission Electron Microscopy Using μSTEM
Microscopy and Microanalysis
Instrumentation
Understanding Imaging and Energy-Loss Spectra Due to Phonon Excitation
Microscopy and Microanalysis
Instrumentation
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Inelastic Electron Scattering Observation Using Energy Filtered Transmission Electron Microscopy for Silicon-Germanium Nanostructures Imaging.
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Defect Characterization Using Transmission Scanning Electron Microscopy
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Instrumentation
Crystal Structure Analysis Using Scanning Transmission Electron Microscopy
Nihon Kessho Gakkaishi
Charge Density Mapping via Scanning Diffraction in Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
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Analysis of Nanostructures With Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
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Recent Breakthroughs in Scanning Transmission Electron Microscopy of Small Species
Advances in Physics: X
Astronomy
Physics
Non-Diffractive Electron Bessel Beams for Scanning Electron Microscopy in Transmission Mode Using Direct Phase Masks
Microscopy and Microanalysis
Instrumentation
Manifold Learning of Four-Dimensional Scanning Transmission Electron Microscopy
npj Computational Materials
Mechanics of Materials
Materials Science
Simulation
Computer Science Applications
Modeling
Annular Bright Field Scanning Transmission Electron Microscopy Imaging Dynamics
Microscopy and Microanalysis
Instrumentation
