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Publications by Shigeaki Tachibana
Selective Backscattered Electron Imaging of Material and Channeling Contrast in Microstructures of Scale on Low Carbon Steel Controlled by Accelerating Voltage and Take-Off Angle
ISIJ International
Mechanics of Materials
Alloys
Materials Chemistry
Metals
Mechanical Engineering
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Observation of Substructure in Steels and Ni200 Using Electron-Channeling Contrast Imaging
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Study of SEM Images Obtained With an Electron Energy and Take-Off Angle (E-Θ) Selective Detector
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SEM Image Observation Using an Electron Energy and Electron Take-Off Angle Filtered Detector
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Low Voltage Electron Diffractive Imaging of Atomic Structure in Single-Wall Carbon Nanotubes
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Focused Ion Beam (FIB) Based Tomography of Dislocations Using Electron Channeling Contrast Imaging (ECCI)
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Making Microbeams and Nanobeams by Channeling in Microstructures and Nanostructures
Physical Review Special Topics - Accelerators and Beams
Comparison of Secondary, Backscattered and Low Loss Electron Imaging for Dimensional Measurements in the Scanning Electron Microscope - Part 2
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