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Publications by Shinichi Ogawa
Tomographic Measurement of Buried Interface Roughness
Microscopy and Microanalysis
Instrumentation
Refractory Metal/Si Substrate Interfacial Reactions During ULSI Processing.
Materia Japan
Synchrotron X-Ray Microdiffraction Studies of Electromigration in Interconnect Lines at the Advanced Light Source
Japan's Defence Policy: Options and Constraints.
Chip-Package Interaction and Crackstop Study for Cu∕Ultra Low-K Interconnects
