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Publications by T. Göbel

Terahertz Detectors From Be-Doped Low-Temperature Grown InGaAs/InAlAs: Interplay of Annealing and Terahertz Performance

English

Advantages of Broad Ion Beam (BIB) Processing Compared With Focused Ion Beam (FIB) Technology for 3D Investigation of Heterogeneous Solids

Microscopy and Microanalysis

Instrumentation

English