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Publications by T. Haccart

Dielectric, Ferroelectric and Piezoelectric Properties of Sputtered PZT Thin Films on Si Substrates: Influence of Film Thickness and Orientation

Semiconductor Physics, Quantum Electronics and Optoelectronics

Electronic Engineering

Molecular Physics,

Magnetic Materials

English

Related publications

Magnetic Properties of La0.6Sr0.4MnO3 Thin Films on SrTiO3 and Buffered Si Substrates With Varying Thickness

Journal of Applied Physics

English

Effect of Thickness on Dielectric, Ferroelectric, and Optical Properties of Ni Substituted Pb(Zr0.2Ti0.8)O3 Thin Films

Journal of Applied Physics

English

Fabrication and Characterization of PZT Fibered-Epitaxial Thin Film on Si for Piezoelectric Micromachined Ultrasound Transducer

Systems Engineering

Mechanical Engineering

Electronic Engineering

English

Epitaxial Growth of MnSb Sputtered Films on Si Substrates-Control of Grain Orientation in MnSb Films-

Journal of the Magnetics Society of Japan

English

Control of Crystallization and Ferroelectric Properties of BaTiO3 Thin Films on Alloy Substrates

English

Measurement and Calculation of PZT Thin Film Longitudinal Piezoelectric Coefficients

Integrated Ferroelectrics

Systems Engineering

Condensed Matter Physics

Electronic Engineering

Materials Chemistry

Magnetic Materials

English

The Influence of Depolarization Field on Dielectric and Pyroelectric Properties of Ferroelectric Films

Semiconductor Physics, Quantum Electronics and Optoelectronics

Electronic Engineering

Molecular Physics,

Magnetic Materials

English

Thickness Dependence of Intrinsic Dielectric Response and Apparent Interfacial Capacitance in Ferroelectric Thin Films

Journal of Applied Physics

English

Scaling Laws in PZT Thin Films Grown on Si(001) and Nb-Doped SrTiO3(001) Substrates

Brazilian Journal of Physics

English