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Publications by T. Heid
Exploratory Dielectric Study Involving Ultra-Low Content of Si-C-Al in Epoxy
Related publications
Influence of Microstructural Inhomogeneity on Fracture Behaviour in SSM-HPDC Al-Si-Cu-Fe Component With Low Si Content
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Rh(I)-Catalyzed Silylation of Aryl and Alkenyl Cyanides Involving the Cleavage of C-C and Si-Si Bonds
Erratum: Corrigendum: Ultra-Low Thermal Conductivity in Si/Ge Hierarchical Superlattice Nanowire
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Determination of Ultra Low Content of Carbon in Iron by Ion-Chromatography
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Dielectric Constant of Nano- CCTO / Epoxy Composite
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Ultra-Low Thermal Conductivities in Large-Area Si-Ge Nanomeshes for Thermoelectric Applications
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Ac Impedance Spectroscopy of Al/a-Sic/C–Si(P)/Al Heterostructure Under Illumination
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Colossal Permittivity and Low Dielectric Loss of Thermal Oxidation Single-Crystalline Si Wafers
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Cholesterol Content of Bull Spermatozoa Alters Survival at Ultra-Low Temperatures
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