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Publications by T. Ohzone
Reduction of Thickness Secondary Defects in MeV Ion Implanted Silicon by Intrinsic Gettering
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Intrinsic Defects in Silicon
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Intrinsic Gettering of Nickel Impuriy Deep Levels in Silicon Substrate
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MeV Electron Irradiation of Ion-Implanted Si-SiO2 Structures
Intrinsic Point-Defect Balance in Self-Ion-Implanted ZnO
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Determination of Complex Dielectric Functions of Ion Implanted and Implanted‐annealed Amorphous Silicon by Spectroscopic Ellipsometry
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Oxygen Gettering by Hafnium Implanted in Beryllium: A 〈0001〉 Hf‐O Dumbbell?
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