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Publications by T.E. Chang
Interface Trap Effect on Gate Induced Drain Leakage Current in Submicron N-MOSFET's
IEEE Transactions on Electron Devices
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
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Impact of Gate Induced Drain Leakage on Overall Leakage of Submicrometer CMOS VLSI Circuits
IEEE Transactions on Semiconductor Manufacturing
Electronic Engineering
Industrial
Condensed Matter Physics
Manufacturing Engineering
Optical
Electrical
Magnetic Materials
Electronic
Investigation of Gate-Induced Drain Leakage (GIDL) Current in Thin Body Devices: Single-Gate Ultra-Thin Body, Symmetrical Double-Gate, and Asymmetrical Double-Gate MOSFETs
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Leakage Current in Deep-Submicron Cmos Circuits
Journal of Circuits, Systems and Computers
Hardware
Electronic Engineering
Electrical
Architecture
The Effects of Nitridation and Re-Oxidation on Drain Leakage Current in N-Channel MOSFETs
Common Origin of Stress-Induced Leakage Current and Electron Trap Generation
Correlation Between Hot Carrier Stress, Oxide Breakdown and Gate Leakage Current for Monitoring Plasma Processing Induced Damage on Gate Oxide
Effects of Gate-Last and Gate-First Process on Deep Submicron Inversion-Mode InGaAs N-Channel Metal-Oxide-Semiconductor Field Effect Transistors
Journal of Applied Physics
Astronomy
Physics
The V-E RELATION AND THE FIELD DISTRIBUTION IN SUBMICRON MOSFET'S
Le Journal de Physique Colloques
Gate Replacement Technique for Reducing Leakage Current in Wallace Tree Multiplier
Journal of Computer Science
Computer Networks
Software
Artificial Intelligence
Communications
