Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by TAZBIT W.
Reliability of Microelectronic Devices From Emitterbase Junction Characterization
The International Conference on Applied Mechanics and Mechanical Engineering
Related publications
Photoemission-Based Microelectronic Devices
Nature Communications
Astronomy
Genetics
Molecular Biology
Biochemistry
Chemistry
Physics
Submicron Resolution Hyperspectral Quantum Rod Thermal Imaging of Microelectronic Devices
ACS Applied Electronic Materials
Fabrication of Palladium-Based Microelectronic Devices by Microcontact Printing
Applied Physics Letters
Astronomy
Physics
Characterization of Ceramic Substrates. Final Report. [Hybrid Microelectronic Circuits]
Ensuring System Reliability: From FET Characterization to Performance Prediction
Reliability Characterization of MEMS Materials
IEEJ Transactions on Sensors and Micromachines
Electronic Engineering
Electrical
Mechanical Engineering
Reliability Overview of RF MEMS Devices and Circuits
Listening to Brain Microcircuits for Interfacing With External World—Progress in Wireless Implantable Microelectronic Neuroengineering Devices
Proceedings of the IEEE
Electronic Engineering
Electrical
Computer Science
Modeling Failure and Reliability in New-Generation Devices