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Publications by Tadahiro Ohmi
SIFT Features Using Vector Quantization Histogram for Image Retrieval
International Journal of Computer and Electrical Engineering
Electric Characteristics of Si3N4 Films Formed by Directly Radical Nitridation on Si (110) and Si (100) Surfaces.
Atomic Order Flattening of Hydrogen-Terminated Si(110) Substrate for Next Generation ULSI Devices
