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Publications by Takahisa HAYASHI
A New Prediction Method for Hot Carrier Degradation of Submicron PMOSFET With Charge Pumping Technique
Related publications
A New Charge-Pumping Technique for Profiling the Interface-States and Oxide-Trapped Charges in MOSFETs
IEEE Transactions on Electron Devices
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
Hot-Carrier Induced Degradation in Surface pMOSFETs.
New Method for Diagnostics of Ion Implantation Induced Charge Carrier Traps in Micro- And Nanoelectronic Devices
World Journal of Nuclear Science and Technology
Deuterium Isotope Effect for AC and DC Hot-Carrier Degradation of MOS Transistors: A Comparison Study
IEEE Transactions on Electron Devices
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
Hot Carrier Induced Degradation and Gamma Radiation Induced Degradation in SiGe HBTs and VCOs
New Passive Cooling as a Technique for Hot Arid Climate
A Watermarking Method With a New SS Technique
Lecture Notes in Computer Science
Computer Science
Theoretical Computer Science
Hot-Carrier-Induced Degradation in P-Type High-Voltage DEMOS Transistors
Charge-Carrier Properties in Synthetic Single-Crystal Diamond Measured With the Transient-Current Technique
Journal of Applied Physics
Astronomy
Physics
