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Publications by Thomas E. Tiwald
Carrier Concentration and Lattice Absorption in Bulk and Epitaxial Silicon Carbide Determined Using Infrared Ellipsometry
Physical Review B
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Near-Infrared Free Carrier Absorption in Heavily Doped Silicon
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Resistivity Anisotropy Measured Using Four Probes in Epitaxial Graphene on Silicon Carbide
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Probing Ultrafast Carrier Dynamics, Nonlinear Absorption and Refraction in Core–shell Silicon Nanowires
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Coherent Thermal Infrared Emission by Two-Dimensional Silicon Carbide Gratings
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Observation of Carrier Densities in Silicon Devices by Infrared Emission
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Correction To: Au2+-Implanted Regions in Silicon Visualized Using a Modulated Free-Carrier Absorption Method
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