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Publications by Tsukasa KURODA

Device Contamination by O2 Plasma Ashing.

Journal of the Surface Finishing Society of Japan
1990English

Clean Surface of Tungsten and Field-Evaporation Mechanism

SHINKU
1969English

Study of High Temperature Reaction Between Ti and SiO2 at Interface in Ti/SiO2/TiSi2/Si System by XPS.

SHINKU
1986English

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