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Publications by Tyler J. Grassman
Advancement of Heteroepitaxial III-V/Si Thin Films Through Defect Characterization
Microscopy and Microanalysis
Instrumentation
Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis
Microscopy and Microanalysis
Instrumentation
Related publications
Heteroepitaxial Nickel-Alloy Thin Films Grown on Diamond
MRS Bulletin
Materials Science
Theoretical Chemistry
Condensed Matter Physics
Physical
Growth and Characterization of III-V Epitaxial Films
Structural and Electrical Characterization of GaN Thin Films on Si(100)
American Journal of Analytical Chemistry
Synthesis and Electrical Characterization of BaTiO3 Thin Films on Si(100)
Materials Sciences and Applications
Structural and Optical Characterization of Pure Si-Rich Nitride Thin Films
Nanoscale Research Letters
Materials Science
Nanotechnology
Condensed Matter Physics
Nanoscience
Stochastic Equation for the Morphological Evolution of Heteroepitaxial Thin Films
Physical Review B
Aberration-Corrected TEM Study of Defects in III-V Films Grown on Si
Microscopy and Microanalysis
Instrumentation
Monolithic III-V/Si Integration
Characterization of Defect Traps in SiO2Thin Films
Active and Passive Electronic Components
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
