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Publications by W. E. Jellett
Accurate Measurement of Extremely Low Surface Recombination Velocities on Charged, Oxidized Silicon Surfaces Using a Simple Metal-Oxide-Semiconductor Structure
Applied Physics Letters
Astronomy
Physics
Related publications
Photo Induced Minority Carrier Annihilation at Crystalline Silicon Surface in Metal Oxide Semiconductor Structure
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Effects of Slow Highly Charged Ion Irradiation on Metal Oxide Semiconductor Capacitors
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
Surfaces
Electronic Engineering
Condensed Matter Physics
Instrumentation
Electronic
Optical
Materials Chemistry
Electrical
Magnetic Materials
Films
Process Chemistry
Coatings
Technology
Surface Treatments on the Characteristics of Metal–Oxide Semiconductor Capacitors
Crystals
Materials Science
Inorganic Chemistry
Chemical Engineering
Condensed Matter Physics
Metal-Oxide-Semiconductor Field Effect Transistor Humidity Sensor Using Surface Conductance
Applied Physics Letters
Astronomy
Physics
A 94GHz Temperature Compensated Low Noise Amplifier in 45nm Silicon-On-Insulator Complementary Metal-Oxide Semiconductor (SOI CMOS)
High Performance High-Κ/Metal Gate Complementary Metal Oxide Semiconductor Circuit Element on Flexible Silicon
Applied Physics Letters
Astronomy
Physics
Dual Model Describing Effects of Evaporated Metal Gate on Low-K Dielectric Methylsilsesquioxane in Metal Oxide Semiconductor Capacitor Structure
Semiconductor Physics, Quantum Electronics and Optoelectronics
Electronic Engineering
Optics
Molecular Physics,
Optical
Electrical
Atomic
Magnetic Materials
Electronic
Very Low Surface Recombination Velocities on P- And N-Type C-Si by Ultrafast Spatial Atomic Layer Deposition of Aluminum Oxide
Applied Physics Letters
Astronomy
Physics
Nanotribology of Clean and Oxidized Silicon Surfaces.
Hyomen Kagaku
