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Publications by W. Hauffe
Advantages of Broad Ion Beam (BIB) Processing Compared With Focused Ion Beam (FIB) Technology for 3D Investigation of Heterogeneous Solids
Microscopy and Microanalysis
Instrumentation
3D Microscopy and Microanalysis of Heterogeneous SEM Samples by Broad Ion Beam Processing: Cutting - Etching - Coating
Microscopy and Microanalysis
Instrumentation
Advances in Broad Ion Beam Processing for 3D Microscopy and Microanalysis of Ceramic Composites
Microscopy and Microanalysis
Instrumentation