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Publications by W. Lefebvre
Atom Counting in Atom Probe Tomography Specimens Using Quantitative HAADF-STEM
Microscopy and Microanalysis
Instrumentation
3D Atom Probe: Chemical Analysis With (Near) Atomic Resolution
Microscopy and Microanalysis
Instrumentation
Related publications
Promoting Standards in Quantitative Atom Probe Tomography Analysis
Microscopy and Microanalysis
Instrumentation
Three-Dimensional Electron Ptychography of Catalyst Nanoparticles Using Combined HAADF STEM and Atom Counting
Microscopy and Microanalysis
Instrumentation
New Applications in Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
High-Throughput, Semi-Automated Quantitative STEM Atom Counting in Supported Metal Nanoparticles Using a Conventional TEM/STEM
Microscopy and Microanalysis
Instrumentation
An Introduction to Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
Distinguishing Meteoritic Nanodiamonds From Disordered Carbon Using Atom-Probe Tomography
Microscopy Today
Understanding Corrosion of 304 Stainless Steels Using Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
Atom Probe Tomography—A Cornerstone in Materials Characterization
MRS Bulletin
Materials Science
Theoretical Chemistry
Condensed Matter Physics
Physical
Mapping Isotopes in Nanoscale and Quantum Materials Using Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
