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Publications by Wataru Mizubayashi
Comparative Study of Charge Trapping Type SOI-FinFET Flash Memories With Different Blocking Layer Materials
Journal of Low Power Electronics and Applications
Electronic Engineering
Electrical
Effects of Aluminum and Nitrogen Profile Control on Electrical Properties of HfAlON Gate Dielectric MOSFETs
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Mo-Doped La2O3 as Charge-Trapping Layer for Improved Low-Voltage Flash-Memory Performance
ECS Solid State Letters
FSAF: File System Aware Flash Translation Layer for NAND Flash Memories
Random Telegraph Signal in Nanoscale Back-Side Charge Trapping Memories
Applied Physics Letters
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Charge Trapping and Detrapping in Polymeric Materials
Journal of Applied Physics
Astronomy
Physics
A FinFET With One Atomic Layer Channel
Nature Communications
Astronomy
Genetics
Molecular Biology
Biochemistry
Chemistry
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Comparative Study on the Charge-Trapping Properties of TaAlO and ZrAlO High-K Composites With Designed Band Alignment
AIP Advances
Nanotechnology
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High Sensitivity Dual-Gate Four-Terminal Magnetic Sensor Compatible With SOI FinFET Technology
IEEE Electron Device Letters
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Investigation of Simulated and Measured Program Characteristicsin 4-Bit/Cell Charge-Trap Flash (CTF) Memories
Journal of the Korean Physical Society
Astronomy
Physics
Data Movement in Flash Memories