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Publications by X. Aymerich
Degradation of Polycrystalline HfO2-based Gate Dielectrics Under Nanoscale Electrical Stress
Applied Physics Letters
Astronomy
Physics
Conduction Mechanisms and Charge Storage in Si-Nanocrystals Metal-Oxide-Semiconductor Memory Devices Studied With Conducting Atomic Force Microscopy
Journal of Applied Physics
Astronomy
Physics
Related publications
The Characteristics of Hole Trapping in HfO2∕SiO2 Gate Dielectrics With TiN Gate Electrode
Applied Physics Letters
Astronomy
Physics
Degradation and Breakdown of Sub-1nm EOT HfO2/Metal Gate Stacks
Electrical Properties of Crystalline YSZ Films on Silicon as Alternative Gate Dielectrics
Semiconductor Science and Technology
Electronic Engineering
Condensed Matter Physics
Optical
Materials Chemistry
Electrical
Magnetic Materials
Electronic
Linearity and Mobility Degradation in Strained Si MOSFETs With Thin Gate Dielectrics
Solid-State Electronics
Electronic Engineering
Condensed Matter Physics
Materials Chemistry
Optical
Electrical
Magnetic Materials
Electronic
Challenges of Electrical Measurements of Advanced Gate Dielectrics in Metal-Oxide-Semiconductor Devices
AIP Conference Proceedings
Astronomy
Physics
Materials Fundamentals of Gate Dielectrics
AlN/GaN Insulated Gate HEMTs With HfO2 Gate Dielectric
Electronics Letters
Electronic Engineering
Electrical
Comparison of Interfacial and Electrical Characteristics of HfO2 and HfAlO High-K Dielectrics on Compressively Strained Si1−xGex
Applied Physics Letters
Astronomy
Physics
Nonvolatile Polycrystalline Silicon Thin-Film-Transistor Memory With Oxide/Nitride/Oxide Stack Gate Dielectrics and Nanowire Channels
Applied Physics Letters
Astronomy
Physics
