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Publications by Y Noh
Microstructural Properties and Defect Evolution on Nitride Compound Semiconductors Grown on Patterned Substrates: A Transmission Electron Microscopy Study
Microscopy and Microanalysis
Instrumentation
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Semiconductor Quantum Dots Grown on Patterned Substrates
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Interfacial and Microstructural Properties of SrTiO3 Thin Films Grown on Si(001) Substrates
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Defect Characterization Using Transmission Scanning Electron Microscopy
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Buried Stressors in Nitride Semiconductors: Influence on Electronic Properties
Journal of Applied Physics
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Electrical Characterization of Thin InAs Films Grown on Patterned W∕GaAs Substrates
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
Comparative Microstructural Study on Mechanical Properties of Concrete Enhanced With Graphite and Graphene Compound
International Journal of Engineering and Technology(UAE)
Architecture
Hardware
Engineering
Chemical Engineering
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Putting a New Spin on Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
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Photoemission Electron Microscopy as a New Tool to Study the Electronic Properties of 2D Crystals and Inhomogeneous Semiconductors
Microscopy and Microanalysis
Instrumentation
Properties of GaN Epilayers Grown on Misoriented Sapphire Substrates
MRS Internet Journal of Nitride Semiconductor Research
