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Publications by Yong-Tian Hou

Spatial and Energetic Distribution of Border Traps in the Dual-Layer HfO2∕SiO2 High-K Gate Stack by Low-Frequency Capacitance-Voltage Measurement

Applied Physics Letters

English

Related publications

Spatial Distributions of Trapping Centers in HfO2∕SiO2 Gate Stacks

Applied Physics Letters

English

Dual-Gate Low-Voltage Transparent Electric-Double-Layer Thin-Film Transistors With a Top Gate for Threshold Voltage Modulation

Chemical Engineering

English

The Characteristics of Hole Trapping in HfO2∕SiO2 Gate Dielectrics With TiN Gate Electrode

Applied Physics Letters

English

A Study of Low-Frequency Noise on High-K/Metal Gate Stacks With in Situ SiOx Interfacial Layer

English

Robust High-Capacitance Polymer Gate Dielectrics for Stable Low-Voltage Organic Field-Effect Transistor Sensors

Advanced Electronic Materials

Magnetic Materials

English

Plasma Surface Interactions in Nanoscale Processing: Preservation of Low-K Integrity and High-K Gate-Stack Etching With Si Selectivity

English

Gate-Defined Quantum-Dot Devices Realized in InGaAs/InP by Incorporating a HfO2 Layer as Gate Dielectric

Applied Physics Letters

English

Effects of Energetic Disorder on the Low-Frequency Differential Capacitance of Organic Light Emitting Diodes

Journal of Applied Physics

English

Study of Gate Oxide Traps in HfO2/AlGaN/GaN Metal-Oxide-Semiconductor High-Electron-Mobility Transistors by Use of Ac Transconductance Method

Applied Physics Letters

English