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Publications by Yongsik Kim
AC Stress-Induced Degradation of Amorphous InGaZnO Thin Film Transistor Inverter
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Related publications
Patterning of Amorphous-InGaZnO Thin-Film Transistors by Stamping of Surface-Modified Polydimethylsiloxane
RSC Advances
Chemistry
Chemical Engineering
Thin Film Transistor
SHINKU
150°C Amorphous Silicon Thin-Film Transistor Technology for Polyimide Substrates
Journal of the Electrochemical Society
Surfaces
Condensed Matter Physics
Optical
Electrochemistry
Sustainability
Materials Chemistry
Magnetic Materials
Renewable Energy
Films
Coatings
Electronic
the Environment
Oxygen-Adsorption-Induced Anomalous Capacitance Degradation in Amorphous Indium-Gallium-Zinc-Oxide Thin-Film-Transistors Under Hot-Carrier Stress
Journal of the Electrochemical Society
Surfaces
Condensed Matter Physics
Optical
Electrochemistry
Sustainability
Materials Chemistry
Magnetic Materials
Renewable Energy
Films
Coatings
Electronic
the Environment
Width Dependent Electrically Stress Degradation of Bottom Gate Amorphous Indium Gallium Zinc Oxide Thin Film Transistors
Instability of Amorphous-Indium Gallium Zinc Oxide (A-Igzo) Thin Film Transistors Under DC and AC Bias Stress
Suppress Temperature Instability of InGaZnO Thin Film Transistors by N2O Plasma Treatment, Including Thermal-Induced Hole Trapping Phenomenon Under Gate Bias Stress
Applied Physics Letters
Astronomy
Physics
Organic Thin-Film Transistor (OTFT)-Based Sensors
Electronics (Switzerland)
Control
Electronic Engineering
Signal Processing
Computer Networks
Systems Engineering
Hardware
Communications
Electrical
Architecture
Proton-Induced Degradation of Thin-Film Microcrystalline Silicon Solar Cells
Journal of Non-Crystalline Solids
Condensed Matter Physics
Materials Chemistry
Optical
Magnetic Materials
Composites
Electronic
Ceramics
