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Publications by Z. Radha
Focused Ion Beam (FIB) Based Tomography of Dislocations Using Electron Channeling Contrast Imaging (ECCI)
Microscopy and Microanalysis
Instrumentation
Related publications
Ion Imaging in a Focused Ion Beam Microscope: Modeling the Channeling Contrast to Construct EBSD-like Orientation Maps
Identification of Cleavage Origins Using Focused Ion Beam (FIB) Sectioning
Microscopy and Microanalysis
Instrumentation
Focused Ion Beam Tomography
Focused Ion Beam (FIB) Microscopy and Technology
Microscopy and Microanalysis
Instrumentation
Investigation of Slice Thickness for FIB Tomography in a Plasma Focused Ion Beam System
Microscopy and Microanalysis
Instrumentation
Ion Channeling Contrast Imaging of Aluminum Wire Bonds
Microscopy and Microanalysis
Instrumentation
Observation of Substructure in Steels and Ni200 Using Electron-Channeling Contrast Imaging
Microscopy and Microanalysis
Instrumentation
Comparison of Dislocation Mapping Using Electron Channeling Contrast Imaging and Cross-Correlation Electron Backscattered Diffraction
Microscopy and Microanalysis
Instrumentation
Three-Dimensional Analysis Using Focused Ion Beam and Electron Microscope
Vacuum and Surface Science
