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A Method for the Measurement of the Turn-On Condition in MOS Transistors

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1972English

CALHYM: A Computer Program for the Automatic Layout of Large Digital Hybrid Microcircuits

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1978English

On Hash Functions Using Checksums

International Journal of Information Security
Information SystemsRiskComputer NetworksCommunicationsReliabilitySafetyQualitySoftware
2009English

Protecting Data Privacy Through Hard-To-Reverse Negative Databases

International Journal of Information Security
Information SystemsRiskComputer NetworksCommunicationsReliabilitySafetyQualitySoftware
2007English

Elastic Block Ciphers: Method, Security and Instantiations

International Journal of Information Security
Information SystemsRiskComputer NetworksCommunicationsReliabilitySafetyQualitySoftware
2009English

CRUST: Cryptographic Remote Untrusted Storage Without Public Keys

International Journal of Information Security
Information SystemsRiskComputer NetworksCommunicationsReliabilitySafetyQualitySoftware
2009English

Preface to the Special Issue on Security in Global Computing

International Journal of Information Security
Information SystemsRiskComputer NetworksCommunicationsReliabilitySafetyQualitySoftware
2004English

Hydrogen-Induced Changes in the Breakdown Voltage of InP HEMTs

IEEE Transactions on Device and Materials Reliability
Electronic EngineeringRiskElectronicOpticalReliabilityElectricalMagnetic MaterialsSafetyQuality
2005English

Optimizing Pulsed OBIC Technique for ESD Defect Localization

IEEE Transactions on Device and Materials Reliability
Electronic EngineeringRiskElectronicOpticalReliabilityElectricalMagnetic MaterialsSafetyQuality
2007English

Special Issue on Silicon Carbide Devices and Technology

IEEE Transactions on Device and Materials Reliability
Electronic EngineeringRiskElectronicOpticalReliabilityElectricalMagnetic MaterialsSafetyQuality
2007English

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