In-Plane Magnetic Field Evaluation With 0.47-Nm Resolution by Aberration-Corrected 1.2-Mv Holography Electron Microscope

Microscopy and Microanalysis- United Kingdom

doi 10.1017/s1431927619001004

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Instrumentation

Date

August 1, 2019

Authors

Toshiaki Tanigaki

Masahiko Ichimura

Yasukazu Murakami

Kazutaka Mitsuishi

Yasuhide Tomioka

Yoshinori Tokura

Hiroyuki Shinada

Publisher

Cambridge University Press (CUP)

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