Amanote Research

Amanote Research

    RegisterSign In

Metrology AFM and Nanometrology

Hyomen Kagaku
doi 10.1380/jsssj.27.662
Full Text
Open PDF
Abstract

Available in full text

Date

January 1, 2006

Authors
Satoshi GONDA
Publisher

Surface Science Society Japan


Related search

Lateral Tip Control Effects in CD-AFM Metrology: The Large Tip Limit

2015English

Development of a New Hybrid Approach Combining AFM and SEM for the Nanoparticle Dimensional Metrology

Beilstein Journal of Nanotechnology
Electronic EngineeringMaterials ScienceNanoscienceElectricalNanotechnologyAstronomyPhysics
2019English

Progress in Nanometrology of MEMS/NEMS Devices

Mechanik
2016English

Biomacromolecules as Tools and Objects in Nanometrology—current Challenges and Perspectives

Analytical and Bioanalytical Chemistry
BiochemistryAnalytical Chemistry
2017English

Metrology for Light and Light for Metrology. Message From the BIPM Director

Measurement Techniques
InstrumentationApplied Mathematics
2015English

Challenges in Nanometrology: High Precision Measurement of Position and Size

TM. Technisches Messen
Electronic EngineeringElectricalInstrumentation
2015English

Metrology and Ergonomic Mensuration Parameters

Work
MedicineEnvironmentalPublic HealthRehabilitationOccupational Health
2012English

Morphological Method for Surface Metrology and Dimensional Metrology Based on the Alpha Shape

Measurement Science and Technology
InstrumentationEngineeringApplied Mathematics
2011English

Cryptographic Quantum Metrology

Physical Review A
OpticsAtomicMolecular Physics,
2019English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy