New Opportunities in Multi-Frame STEM Spectroscopy & Fractional Beam-Current EELS

doi 10.1002/9783527808465.emc2016.6336
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Wiley-VCH Verlag GmbH & Co. KGaA

Related search

Single Reference Frame Multiple Current Macroblocks Scheme for Multi-Frame Motion Estimation in H.264/Avc

English

Atomic-Resolution EELS in Aberration-Corrected STEM

Microscopy and Microanalysis
Instrumentation
2003English

STEM/EELS Studies of Nanoparticles

Microscopy and Microanalysis
Instrumentation
2006English

Near-Simultaneous Core- And Low-Loss EELS Spectrum-Imaging in the STEM Using a Fast Beam Switch.

Microscopy and Microanalysis
Instrumentation
2006English

Minimize Electron Beam Damage During Characterization of Carbon-Depletion in Ultra Low-K Dielectric Materials by STEM EELS Elemental Mapping

Microscopy and Microanalysis
Instrumentation
2016English

A New Impulsive Multi-Orders Fractional Differential Equation Involving Multipoint Fractional Integral Boundary Conditions

Abstract and Applied Analysis
Applied MathematicsAnalysis
2014English

STEM/EELS Analysis of Conversion Reactions in Cycled FeOF/C

Microscopy and Microanalysis
Instrumentation
2014English

STEM-EELS Study of Dynamic Behavior of Helium in Si

Materia Japan
2019English

Using Neural Network Algorithms for Compositional Mapping in STEM EELS

Microscopy and Microanalysis
Instrumentation
2009English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy