Near-Simultaneous Core- And Low-Loss EELS Spectrum-Imaging in the STEM Using a Fast Beam Switch.

Microscopy and Microanalysis- United Kingdom

doi 10.1017/s1431927606065512

Full Text

Abstract

Available in

Categories

Instrumentation

Date

July 31, 2006

Authors

Publisher

Cambridge University Press (CUP)

Related search

New Opportunities in Multi-Frame STEM Spectroscopy & Fractional Beam-Current EELS

English

Atomic-Scale Optical and Vibrational Spectroscopy With Low Loss EELS

Microscopy and Microanalysis

Instrumentation

English

Low-Loss Superconducting Nanowire Circuits Using a Neon Focused Ion Beam

Physical Review Applied

English

Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM

Microscopy and Microanalysis

Instrumentation

English

A Low-Loss High-Linearity SOI SP6T Antenna Switch Using Diode Biasing Method

IEICE Electronics Express

Electronic Engineering

Condensed Matter Physics

Magnetic Materials

English

Simultaneous Near-Infrared Diffusive Light and Ultrasound Imaging

English

Local Elemental and Electronic Structure Analysis Using STEM-EELS

Nihon Kessho Gakkaishi

English

Fast Electron Beam Guiding for Effective Core Heating

EPJ Web of Conferences

English

The Triggered Pseudo-Spark Chamber as a Fast Switch and as a High-Intensity Beam Source

Nuclear Instruments and Methods in Physics Research

English