Thickness Mapping of High-Κ Dielectrics at the Nanoscale

Applied Physics Letters - United States
doi 10.1063/1.4863947
Full Text
Abstract

Available in full text

Date
Authors
Publisher

AIP Publishing

Related search

Tunable High-Κ ZrxAl1−xOy Thin Film Dielectrics From All-Inorganic Aqueous Precursor Solutions

RSC Advances
ChemistryChemical Engineering
2017English

Frequency Dependence of C-V Characteristics of MOS Capacitors Containing Nanosized High-Κ Ta2O5 Dielectrics

Advances in Materials Science and Engineering
Materials ScienceEngineering
2017English

Degradation of Polycrystalline HfO2-based Gate Dielectrics Under Nanoscale Electrical Stress

Applied Physics Letters
AstronomyPhysics
2011English

High K Dielectrics on High-Mobility Substrates: The Interface!

Electrochemical Society Interface
Electrochemistry
2011English

Electrochemistry at the Nanoscale

Nanoscale
Materials ScienceNanotechnologyNanoscience
2016English

Ferroelectricity at the Nanoscale

Physics-Uspekhi
AstronomyPhysics
2014English

Minerals at the Nanoscale

2013English

Erratum To: “Estimation of Thermal Expansion Coefficient of Solid Crystalline Dielectrics at High Temperatures”

Journal of Contemporary Physics
AstronomyPhysics
2015English

The Ferroelectricity at the Nanoscale

Ferroelectrics
OpticalElectronicCondensed Matter PhysicsMagnetic Materials
2014English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy