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A Novel Hot DI Water Rinse on SOD Filled Self-Aligned Shallow Trench Isolation for Highly Reliable NAND Flash Memory

doi 10.7567/ssdm.2010.p-1-17
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Abstract

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Date

September 23, 2010

Authors
C. H. LiuY. M. LinR. T. PengH. C. WeiH. J. ChienY. T. ChiuL. T. KuoH. P. HwangM. S. LeeS. Pittikoun
Publisher

The Japan Society of Applied Physics


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