A Novel Hot DI Water Rinse on SOD Filled Self-Aligned Shallow Trench Isolation for Highly Reliable NAND Flash Memory

doi 10.7567/ssdm.2010.p-1-17
Full Text
Abstract

Available in full text

Date
Authors
Publisher

The Japan Society of Applied Physics

Related search

Highly Reliable N2o-Oxynitrided Tunnel Oxides for Flash Memory

1994English

Bit Error Generation for NAND Flash Memory

2016English

Self-Learning Hot Data Prediction: Where Echo State Network Meets NAND Flash Memories

IEEE Transactions on Circuits and Systems I: Regular Papers
Electronic EngineeringElectrical
2020English

Nanotopography Issues in Shallow Trench Isolation CMP

MRS Bulletin
Materials ScienceTheoretical ChemistryCondensed Matter PhysicsPhysical
2002English

A Novel Three-Dimensional NAND Flash Structure for Improving the Erase Performance

IEICE Electronics Express
Electronic EngineeringCondensed Matter PhysicsOpticalElectricalMagnetic MaterialsElectronic
2019English

Container Density Improvements With Dynamic Memory Extension Using NAND Flash

2018English

Challenges in Hardening Technologies Using Shallow-Trench Isolation

1998English

Extending the Lifetime of NAND Flash Memory by Salvaging Bad Blocks

2012English

Alternative Erase Verify: The Optimization for Longer Data Retention of NAND FLASH Memory

International Journal of Control and Automation
ControlSystems Engineering
2017English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy