Amanote Research

Amanote Research

    RegisterSign In

Highly Reliable N2o-Oxynitrided Tunnel Oxides for Flash Memory

doi 10.7567/ssdm.1994.c-9-3
Full Text
Open PDF
Abstract

Available in full text

Date

January 1, 1994

Authors
Masahiro UshiyamaMasataka KatoTetsuo AdachiHitoshi KumeNaoki MiyamotoToshiyuki MineKiyoshi OgataTakashi NishidaYuzuru Ohji
Publisher

The Japan Society of Applied Physics


Related search

A Novel Hot DI Water Rinse on SOD Filled Self-Aligned Shallow Trench Isolation for Highly Reliable NAND Flash Memory

2010English

Bit Error Generation for NAND Flash Memory

2016English

Flash Correct-And-Refresh: Retention-Aware Error Management for Increased Flash Memory Lifetime

2012English

Trilayer Tunnel Selectors for Memristor Memory Cells

Advanced Materials
Mechanics of MaterialsMaterials ScienceNanotechnologyMechanical EngineeringNanoscience
2015English

Integrated Design Methodology for Highly Reliable Liquid Rocket Engine

JOURNAL OF THE JAPAN SOCIETY FOR AERONAUTICAL AND SPACE SCIENCES
2006English

Competitive Analysis of Flash-Memory Algorithms

Lecture Notes in Computer Science
Computer ScienceTheoretical Computer Science
2006English

Towards Highly Reliable Autonomy for Urban Search and Rescue Robots

Lecture Notes in Computer Science
Computer ScienceTheoretical Computer Science
2015English

Block-Based Allocation Algorithms for FLASH Memory in Embedded Systems

Lecture Notes in Computer Science
Computer ScienceTheoretical Computer Science
English

A Case for Flash Memory SSD in Enterprise Database Applications

2008English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy