Bit Error Generation for NAND Flash Memory

doi 10.14257/astl.2016.139.22
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Science & Engineering Research Support soCiety

Related search

Container Density Improvements With Dynamic Memory Extension Using NAND Flash

2018English

Extending the Lifetime of NAND Flash Memory by Salvaging Bad Blocks

2012English

Alternative Erase Verify: The Optimization for Longer Data Retention of NAND FLASH Memory

International Journal of Control and Automation
ControlSystems Engineering
2017English

Flash Correct-And-Refresh: Retention-Aware Error Management for Increased Flash Memory Lifetime

2012English

FSAF: File System Aware Flash Translation Layer for NAND Flash Memories

2009English

A Dynamic Scratchpad Memory Collaborated With Cache Memory for Transferring Data for Multi-Bit Error Correction

International Journal of Trend in Scientific Research and Development
2018English

A Novel Hot DI Water Rinse on SOD Filled Self-Aligned Shallow Trench Isolation for Highly Reliable NAND Flash Memory

2010English

A Novel Three-Dimensional NAND Flash Structure for Improving the Erase Performance

IEICE Electronics Express
Electronic EngineeringCondensed Matter PhysicsOpticalElectricalMagnetic MaterialsElectronic
2019English

New Erase Verify Scheme for Improving the Cycling Endurance of 2xnm NAND Flash Cell

2012English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy